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Webinar first run 24 June 2015.
"Testing Considerations for Electronics and Electronic Components – An Expert Overview"
Presented by Jeff Andrasik
In this presentation, Smithers Rapra Product Test Manager Jeff Andrasik discusses key considerations for life cycle testing for electronics. He reveals some of the most common factors that contribute to electronic component failure and how external testing can significantly aid in reducing the time to market for new electronic products.
This webinar covers:
Common failure modes under various considerations and applications
Common and industry standard test methods, specifically for the automotive industry
Test setup considerations and conditions in real-world examples
Increasing efficiency in product development and validation procedures by adding external testing to the mix
Find out more about Smithers Rapra's service capabilities for Electronics Testing.